Product Categories Site Menu Products by Vendor Axic Secon Ultech Nanoview Thin Film Metrology XRF Ellipsometers Etch & Deposition Plasma Microwave Refurbished Equipment

Products ETCH & DEPOSITION (Barrel, RIE, ICP) THIN FILM MEASUREMENT (Ellipsometer, Film Thickness, n&k)  RTP (Rapid Thermal Processing) MICROWAVE ETCH (Wafer Thinning, Dicing) REFURBISHED EQUIPMENT (Ion Mill, Sputter) "Reactive Ion Etching Equipment"   Benchmark RIE/PECVD Innovative, highly flexible R&D Plasma tool.       Login Partners Home Contact Us Copyright © 2005 Axic Incorporated.  All rights reserved.